TTTC: EWDTS 2012 Call for Papers - Submission Deadline July 31!

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

The main target of the IEEE East-West Design & Test Symposium (EWDTS) is to exchange experiences between scientists and technologies of Eastern and Western Europe, as well as North America and other parts of the world, in the field of design, design automation and test of electronic circuits and systems. The symposium is typically held in countries around the Black Sea, the Baltic Sea and Central Asia region. We cordially invite you to participate and submit your contributions to EWDTS’12 which covers (but is not limited to) the following topics:

Analog, Mixed-Signal and RF Test
Analysis and Optimization
ATPG and High-Level Test
Built-In Self Test
Debug and Diagnosis
Defect/Fault Tolerance and Reliability
Design for Testability
Design Verification and Validation
EDA Tools for Design and Test
Embedded Software Performance
Failure Analysis, Defect and Fault
FPGA Test
HDL in test and test languages
High-level Synthesis
High-Performance Networks and Systems on a Chip
Low-power Design
Memory and Processor Test
Modeling & Fault Simulation
Network-on-Chip Design & Test
Modeling and Synthesis of Embedded Systems

Object-Oriented System Specification and Design
On-Line Testing
Power Issues in Design & Test
Real Time Embedded Systems
Reliability of Digital Systems
Scan-Based Techniques
Self-Repair and Reconfigurable Architectures
Signal and Information Processing in Radio andCommunication Engineering
System Level Modeling, Simulation & Test Generation
System-in-Package and 3D Design & Test
Using UML for Embedded System Specification
CAD and EDA Tools, Methods and Algorithms
Design and Process Engineering
Logic, Schematic and System Synthesis
Place and Route
Thermal, Timing and Electrostatic Analysis of SoCs and Systems on Board
Wireless and RFID Systems Synthesis
Digital Satellite Television

Venue

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The Symposium will take place in Kharkov, Ukraine, one of the biggest scientific and industrial center. Venue of EWDTS 2012 is Kharkov National University of Radioelectronics was founded 81 years ago. It was one of the best University of Soviet Union during 60th - 90th in the field of Radioelectronics. Today University is the leader among technical universities in Ukraine.

Submissions

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Papers submission info: http://www.ewdtest.com/conf
The best reports, made in the Symposium will be published in IEEE Design & Test Magazine and Radioelectronics and Informatics Journal (ISSN 1563-0064); the last one is serving electronic test professionals in concurrence with the Test Technology Technical Council (TTTC) of the IEEE Computer Society.

Key Dates

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Submission deadline: July 31, 2012
Notification of acceptance: August 25, 2012
Final copy deadline: TBD

Additional Information

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Organizing committee address:

Prof. Vladimir Hahanov
Design Automation Department
Kharkov National University of Radioelectronics
Lenin ave, 14, Kharkov, 61166, Ukraine.
Tel.: +380-57-702-13-26
E-mail: hahanov@kture.kharkov.ua
www.ewdtest.com/conf/

The symposium is organized by Kharkov National University of Radio Electronics and Science
Academy of Applied Radio Electronics http://anpre.org.ua/ in cooperation with Tallinn University of
Technology. It is technically co-sponsored by the IEEE Computer Society Test Technology Technical
Council (TTTC) and financially supported by Aldec, Synopsys, Kaspersky Lab, Cadence, DataArt Lab,
Тallinn Technical University, JTAG Technologies.

Committees

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General Chairs
V. Hahanov – Ukraine
Y. Zorian – USA

General Vice-Chairs
R. Ubar – Estonia
P. Prinetto – Italy

Program Chairs
S. Shoukourian – Armenia
D. Speranskiy – Russia

Program Vice-Chairs
Z. Navabi – Iran
M. Renovell – France

Publicity Chairs
S. Mosin – Russia
G. Markosyan – Armenia

Public Relation Chair
V. Djigan – Russia

Program Committee
E. J. Aas – Norway
J. Abraham – USA
M. Adamski – Poland
Ashraf Elsayed Mohamed
Mohamed – Egypt
А. Barkalov – Poland
R. Bazylevych – Ukraine
V. Djigan – Russia
A. Drozd – Ukraine
E. Evdokimov – Ukraine
A. Chaterjee – USA
E. Gramatova – Slovakia
A. Ivanov – Canada
M. Karavay – Russia
V. Kharchenko – Ukraine
K. Kuchukjan – Armenia
W. Kuzmicz – Poland
A. Matrosova – Russia
V. Melikyan – Armenia
O. Novak – Czech Republic
Z. Peng – Sweden
A. Petrenko – Ukraine
D. Puzankov - Russia
J. Raik – Estonia
A. Romankevich – Ukraine
A. Ryjov – Russia
R. Seinauskas – Lithuania
S. Sharshunov – Russia
A. Singh – USA
J. Skobtsov – Ukraine
V. Tverdokhlebov – Russia
V. Vardanian – Armenia
V. Yarmolik – Byelorussia

Steering Committee
M. Bondarenko – Ukraine
V. Hahanov – Ukraine
R. Ubar – Estonia
Y. Zorian – USA
Organizing Committee
S. Chumachenko – Ukraine
E. Litvinova – Ukraine
V. Kharchenko – Ukraine

For more information, visit us on the web at: http://www.ewdtest.com/conf

The Event Name (Event2012) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC) and the IEEE Computer Society Design Automation Technical Committee.